Virtual Union Catalogue
Autotest con'82 int automatic testing conf dayton convention center
CSIR - Central Electronics Engineering Research Institute (CEERI)
| Field | Value | |
| Title |
Autotest con'82 int automatic testing conf dayton convention center
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| Creator |
Institute Of Electrical & Electronics Engineers(IEEE)
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| Type |
text
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| Publisher |
Dayton
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| Language |
eng
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| Identifier |
http://210.212.103.5:80/cgi-bin/koha/opac-detail.pl?biblionumber=13595
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