Virtual Union Catalogue
Applied surface analysis-a symp spon by astm committee e-42 on surface analysis astm cleveland,Ohio 28 feb.-1 mar. 1978
CSIR - Central Electronics Engineering Research Institute (CEERI)
| Field | Value | |
| Title |
Applied surface analysis-a symp spon by astm committee e-42 on surface analysis astm cleveland,Ohio 28 feb.-1 mar. 1978
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| Creator |
American Society For Testing And Materials(ASTM)
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| Type |
text
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| Publisher |
—
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| Date |
1978
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| Language |
eng
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| Identifier |
http://210.212.103.5:80/cgi-bin/koha/opac-detail.pl?biblionumber=13563
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