Virtual Union Catalogue
Adhesion measurement of thin films, Thick films, & bulk coatings-a symp presented at astm headquarters...2-4 nov
CSIR - Central Electronics Engineering Research Institute (CEERI)
| Field | Value | |
| Title |
Adhesion measurement of thin films, Thick films, & bulk coatings-a symp presented at astm headquarters...2-4 nov
|
|
| Creator |
American Society For Testing And Materials(ASTM)
|
|
| Type |
text
|
|
| Publisher |
—
|
|
| Date |
1976
|
|
| Language |
eng
|
|
| Identifier |
http://210.212.103.5:80/cgi-bin/koha/opac-detail.pl?biblionumber=13562
|
|